Ralf Ebersbach

Inventor

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Work History

Patent OwnerApplications FiledYear
CARL ZEISS MEDITEC AG
2
8
5
2
2
7
2
1
2008
2009
2010
2011
2012
2013
2014
2017

Inventor Addresses

AddressDuration
Jena, DEMar 24, 11 - Mar 24, 11
Schmölin, DEAug 02, 22 - Aug 02, 22
Schmölln, DEMar 05, 13 - Aug 15, 24
Schmölln, USAug 04, 22 - Aug 04, 22
Schmoelin, DESep 30, 14 - Sep 30, 14
Schmoelln, DEMay 12, 11 - Nov 15, 16
Schmolln, DEAug 26, 10 - Nov 05, 20

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 18
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 5
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0268,6632024DEVICE AND METHOD FOR DIAGNOSIS, AND FOR PLANNING AND/OR MONITORING AN OPERATION ON THE EYE0
119508462024Device for reliably determining biometric measurement variables of the whole eye0
2022/0400,9472022DEVICE FOR RELIABLY DETERMINING BIOMETRIC MEASUREMENT VARIABLES OF THE WHOLE EYE0
2022/0244,1782022METHOD FOR CONTROLLING A SEMICONDUCTOR-LASER-DIODE-BASED SS- INTERFEROMETER SYSTEM0
113997142022Device for reliably determining biometric measurement variables of the whole eye0

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