FRANK ARNOLDUS JOHANNES MARIA DRIESSEN
Inventor
Stats
- 0 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 4 US Applications Filed
- 74 Total Citation Count
- Sep 10, 2021 Most Recent Filing
- Nov 14, 2014 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
ASML NETHERLANDS B.V. | 1
| 2014
|
Inventor Addresses
Address | Duration |
---|---|
Kranenburg-Niel, DE | May 03, 18 - Dec 17, 19 |
Veldhoven, NL | Oct 27, 16 - Dec 30, 21 |
Technology Profile
Technology | Matters | |
---|---|---|
G01V: | GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS | 1 |
G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 4 |
G06F: | ELECTRIC DIGITAL DATA PROCESSING | 3 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2021/0405,545 | 2021 | YIELD ESTIMATION AND CONTROL | 0 |
11119414 | 2021 | Yield estimation and control | 3 |
2020/0257,208 | 2020 | YIELD ESTIMATION AND CONTROL | 2 |
10627723 | 2020 | Yield estimation and control | 7 |
10509310 | 2019 | Patterning devices for use within a lithographic apparatus, methods of making and using such patterning devices | 0 |
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