FRANK ARNOLDUS JOHANNES MARIA DRIESSEN

Inventor

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Work History

Patent OwnerApplications FiledYear
ASML NETHERLANDS B.V.
1
2014

Inventor Addresses

AddressDuration
Kranenburg-Niel, DEMay 03, 18 - Dec 17, 19
Veldhoven, NLOct 27, 16 - Dec 30, 21

Technology Profile

Technology Matters
G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 1
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 4
G06F: ELECTRIC DIGITAL DATA PROCESSING 3

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2021/0405,5452021YIELD ESTIMATION AND CONTROL0
111194142021Yield estimation and control3
2020/0257,2082020YIELD ESTIMATION AND CONTROL2
106277232020Yield estimation and control7
105093102019Patterning devices for use within a lithographic apparatus, methods of making and using such patterning devices0

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