Daniel P Cram
Inventor
Stats
- 44 US patents issued
- 51 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 44 US Patents Issued
- 51 US Applications Filed
- 515 Total Citation Count
- Dec 7, 2023 Most Recent Filing
- Aug 28, 2000 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| U.S. BANK NATIONAL ASSOCIATION | 1
1 2 | 2005
2007 2008 |
| HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. | 1
| 2002
|
| MICRON TECHNOLOGY, INC. | 4
2 5 9 10 7 12 2 7 2 2 | 2000
2001 2002 2003 2004 2005 2006 2007 2008 2009 2011 |
Inventor Addresses
| Address | Duration |
|---|---|
| Boise, ID | Oct 08, 02 - Nov 25, 08 |
| Boise, ID, US | Nov 07, 02 - Jun 13, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B21F: | WORKING OR PROCESSING OF WIRE | 1 |
| B23K: | SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM | 2 |
| B65G: | TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0194,281 | 2024 | THERMAL CONDUCTION BASED BATCH TESTING SYSTEM | 0 |
| 8624615 | 2014 | Isolation circuit | 0 |
| 2012/0001,680 | 2012 | ISOLATION CIRCUIT | 0 |
| 8074353 | 2011 | Methods of providing semiconductor components within sockets | 1 |
| 8063646 | 2011 | Apparatus and methods for testing microelectronic devices | 1 |
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