Jeffrey N Correll

Inventor

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Stats

Details

Work History

Patent OwnerApplications FiledYear
NATIONAL INSTRUMENTS CORPORATION
9
9
4
14
4
2
14
2
4
2
2
1
2002
2003
2005
2007
2009
2010
2011
2012
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Cedar Park, TXMay 29, 03 - Dec 11, 08
Cedar Park, TX, USMay 22, 03 - May 29, 18

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 3
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
99838522018Graphical specification and constraint language for developing programs for hardware implementation and use2
95580992017Staged program compilation with automated timing closure0
2016/0350,0802016Graphical Specification and Constraint Language for Developing Programs for Hardware Implementation and Use18
94364382016Graphical specification and constraint language for developing programs for hardware implementation and use4
93359772016Optimization of a data flow program based on access pattern information21

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