Dennis R Conti
Inventor
Stats
- 5 US patents issued
- 15 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 15 US Applications Filed
- 248 Total Citation Count
- Mar 12, 2020 Most Recent Filing
- Mar 10, 1986 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| INTERNATIONAL BUSINESS MACHINES CORPORATION | 1
1 2 2 2 | 1986
2001 2003 2011 2016 |
| KABUSHIKI KAISHA NIHON MICRONICS | 1
| 1999
|
| GOOGLE LLC | 2
| 2003
|
Inventor Addresses
| Address | Duration |
|---|---|
| Essex Junction, VT | Jun 14, 88 - Sep 04, 07 |
| Essex Junction, VT, US | Jan 06, 05 - Jun 08, 21 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B23K: | SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM | 5 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 11 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 11029334 | 2021 | Low force wafer test probe | 0 |
| 11009545 | 2021 | Integrated circuit tester probe contact liner | 0 |
| 2020/0209,308 | 2020 | INTEGRATED CIRCUIT TESTER PROBE CONTACT LINER | 0 |
| 10670653 | 2020 | Integrated circuit tester probe contact liner | 0 |
| 10663487 | 2020 | Low force wafer test probe with variable geometry | 0 |
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