Yeon Shik Choi
Inventor
Stats
- 3 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 5 US Applications Filed
- 114 Total Citation Count
- Jul 15, 2016 Most Recent Filing
- Jan 23, 1997 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
KOREA ELECTRONICS TECHNOLOGY INSTITUTE | 1
2 2 | 2002
2008 2016 |
NEC CORPORATION | 1
| 1997
|
YUHAN CORPORATION | 1
| 1997
|
Inventor Addresses
Address | Duration |
---|---|
Gyeonggi-do, KR | Jan 08, 09 - Jan 04, 11 |
Seoul, KR | Dec 26, 02 - Aug 28, 18 |
Suwon-Si, KR | May 12, 98 - May 12, 98 |
Technology Profile
Technology | Matters | |
---|---|---|
A61K: | PREPARATIONS FOR MEDICAL, DENTAL, OR TOILET PURPOSES | 1 |
C07D: | HETEROCYCLIC COMPOUNDS | 1 |
G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
10063800 | 2018 | Image sensor using nanowire and method of manufacturing the same | 0 |
9960299 | 2018 | Avalanche photodiode using silicon nanowire and silicon nanowire photomultiplier using the same | 0 |
2017/0186,895 | 2017 | AVALANCHE PHOTODIODE USING SILICON NANOWIRE AND SILICON NANOWIRE PHOTOMULTIPLIER USING THE SAME | 1 |
2017/0187,974 | 2017 | IMAGE SENSOR USING NANOWIRE AND METHOD OF MANUFACTURING THE SAME | 0 |
7863569 | 2011 | Apparatus for analyzing cells in real-time | 6 |
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