Hwang Ho Choi

Inventor

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Work History

Patent OwnerApplications FiledYear
SAMSUNG ELECTRONICS CO., LTD.
2
2015
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY
2
2012

Inventor Addresses

AddressDuration
Busan, KRJun 06, 19 - Mar 11, 25
Hwasung, KRJul 03, 18 - Jul 03, 18
Hwasung-City, KRJul 21, 16 - Jul 21, 16
Saha-gu, KRApr 14, 16 - Apr 14, 16
Stanford, CA, USJan 01, 15 - Jan 26, 16

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 1
E02D: FOUNDATIONS; EXCAVATIONS; EMBANKMENTS 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122480182025Semiconductor chip and test method of the same0
2023/0176,1122023SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME0
114830002022Interface circuit and interface device0
2022/0014,1952022INTERFACE CIRCUIT AND INTERFACE DEVICE0
104765102019Clock and data recovery device and method using current-controlled oscillator0

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