Gwangho CHOI

Inventor

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Inventor Addresses

AddressDuration
Gyeonggi-do, KRAug 12, 21 - Jun 11, 24
Suwon-si, KRApr 08, 21 - Mar 18, 25
Tucson, AZ, USMay 26, 22 - Jul 11, 23

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 2
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122548012025Electronic device including display and method for operating same0
2025/0047,9792025ELECTRONIC DEVICE AND METHOD FOR USING CAMERA ACCORDING TO WEARING OF LENS-TYPE ACCESSORY0
121894312025Electronic device and method for operating electronic device0
2024/0429,2562024SHIELDING STRUCTURE FOR REDUCING CROSSTALK OF OPTICAL SENSOR AND METHOD FOR MANUFACTURING SAME0
121545272024Electronic device for configuring luminance of display by using illuminace sensor0

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