Kazuo Chinone
Inventor
Stats
- 9 US patents issued
- 16 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 9 US Patents Issued
- 16 US Applications Filed
- 96 Total Citation Count
- Jul 23, 2018 Most Recent Filing
- Feb 24, 1992 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| SII NANOTECHNOLOGY INC. | 1
1 3 2 | 1992
1994 1996 1998 |
| HITACHI HIGH-TECH SCIENCE CORPORATION | 1
2 2 3 | 1996
2003 2016 2017 |
Inventor Addresses
| Address | Duration |
|---|---|
| Chiba, JP | Oct 20, 98 - Dec 13, 05 |
| Chiba-shi, JP | Jan 22, 04 - Jan 22, 04 |
| Tokyo, JP | Apr 26, 94 - Feb 02, 21 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10908104 | 2021 | Radiation analysis apparatus | 1 |
| 10801977 | 2020 | Radiation analyzing apparatus and radiation analyzing method | 0 |
| 2019/0033,237 | 2019 | Radiation Analysis Apparatus | 0 |
| 10151773 | 2018 | Scanning probe microscope and probe contact detection method | 0 |
| 2018/0275,079 | 2018 | Radiation Analyzing Apparatus | 0 |
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