Michel Chevroulet

Inventor

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Work History

Patent OwnerApplications FiledYear
SEMTECH CORPORATION
2
2
2
2
2005
2008
2013
2014
SEMTECH NEUCHATEL SA
1
2005
CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA
1
1994

Inventor Addresses

AddressDuration
Neuchatel, CHDec 05, 95 - Feb 21, 17

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
95749072017Semiconductor device and method of direct measurement and acquisition of MEMS employing sigma-delta loop2
93791032016Semiconductor device and method of preventing latch-up in a charge pump circuit1
2014/0266,2512014Semiconductor Device and Method of Direct Measurement and Acquisition of MEMS Employing Sigma-Delta Loop3
2014/0103,4152014Semiconductor Device and Method of Preventing Latch-Up in a Charge Pump Circuit2
84563832013Circuit and method for controlling a liquid crystal segment display6

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