Joel Chevrier

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
EUROPEAN SYNCHROTRON RADIATION FACILITY
1
2007
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
1
2007
UNIVERSITE JOSEPH FOURIER
1
2007
INSTITUT NATIONAL POLYTECHNIQUE DE GRENOBLE
1
2007

Inventor Addresses

AddressDuration
Saint Egreve, FRMar 11, 10 - Mar 11, 10

Technology Profile

Technology Matters
G01Q: SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] 1

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2010/0064,3972010CONTROLLED ATOMIC FORCE MICROSCOPE1

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.