Hui-Yun Chao
Inventor
Stats
- 8 US patents issued
- 9 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 8 US Patents Issued
- 9 US Applications Filed
- 51 Total Citation Count
- Mar 16, 2015 Most Recent Filing
- Jun 9, 2010 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. | 4
6 4 2 | 2010
2012 2013 2015 |
Inventor Addresses
Address | Duration |
---|---|
Zhubei City, TW | Dec 29, 11 - Jul 09, 15 |
Zhubei, TW | Dec 15, 11 - Dec 25, 18 |
Technology Profile
Technology | Matters | |
---|---|---|
D06F: | LAUNDERING, DRYING, IRONING, PRESSING OR FOLDING TEXTILE ARTICLES | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
10161965 | 2018 | Method of test probe alignment control | 6 |
9165843 | 2015 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | 1 |
9158867 | 2015 | 2D/3D analysis for abnormal tools and stages diagnosis | 1 |
2015/0192,616 | 2015 | Method of Test Probe Alignment Control | 2 |
2015/0125,970 | 2015 | SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR SEMICONDUCTOR WAFER FABRICATION PROCESSES | 4 |
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