Hui-Yun Chao

Inventor

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Work History

Patent OwnerApplications FiledYear
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
4
6
4
2
2010
2012
2013
2015

Inventor Addresses

AddressDuration
Zhubei City, TWDec 29, 11 - Jul 09, 15
Zhubei, TWDec 15, 11 - Dec 25, 18

Technology Profile

Technology Matters
D06F: LAUNDERING, DRYING, IRONING, PRESSING OR FOLDING TEXTILE ARTICLES 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
101619652018Method of test probe alignment control6
91658432015Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes1
915886720152D/3D analysis for abnormal tools and stages diagnosis1
2015/0192,6162015Method of Test Probe Alignment Control2
2015/0125,9702015SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR SEMICONDUCTOR WAFER FABRICATION PROCESSES4

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