Curt H Chadwick
Inventor
Stats
- 15 US patents issued
- 19 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 15 US Patents Issued
- 19 US Applications Filed
- 626 Total Citation Count
- Aug 7, 2008 Most Recent Filing
- Jan 3, 1978 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| GTE SYLVANIA INCORPORATED | 3
| 1978
|
| GTE GOVERNMENT SYSTEMS CORPORATION | 3
| 1978
|
| KLA-TENCOR CORPORATION | 1
| 1995
|
| KLA Instruments Corporation | 4
1 2 3 1 2 1 1 | 1984
1985 1988 1989 1997 2002 2005 2008 |
Inventor Addresses
| Address | Duration |
|---|---|
| 220 Wooded View Rd., Los Gatos, CA 95032 | Feb 04, 92 - Jul 21, 92 |
| Los Altos, CA | Jan 01, 80 - Mar 03, 87 |
| Los Gatos, CA | Oct 31, 89 - Dec 11, 08 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A47B: | TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE | 1 |
| B29C: | SHAPING OR JOINING OF PLASTICS; SHAPING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL; AFTER- TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING | 1 |
| F16H: | GEARING | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2008/0304,734 | 2008 | Alignment correction prio to image sampling in inspection systems | 5 |
| 2005/0254,698 | 2005 | Alignment correction prior to image sampling in inspection systems | 1 |
| 2003/0063,190 | 2003 | Alignment correction prior to image sampling in inspection systems | 2 |
| 2002/0075,385 | 2002 | Alignment correction prior to image sampling in inspection systems | 0 |
| RE37740 | 2002 | Method and apparatus for optical inspection of substrates | 12 |
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