Ying-Yen CHEN
Inventor
Stats
- 6 US patents issued
- 28 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 6 US Patents Issued
- 28 US Applications Filed
- 36 Total Citation Count
- Apr 15, 2024 Most Recent Filing
- Apr 20, 2012 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| REALTEK SEMICONDUCTOR CORP. | 5
3 3 1 1 1 | 2012
2013 2014 2015 2016 2017 |
Inventor Addresses
| Address | Duration |
|---|---|
| Chia Yi County, TW | Nov 01, 12 - Dec 02, 14 |
| Chiayi County, TW | Oct 24, 13 - Sep 01, 20 |
| HSINCHU CITY, TW | Jun 28, 18 - Jun 28, 18 |
| HSINCHU, TW | Feb 03, 22 - Jul 27, 23 |
| HsinChu, TW | Oct 19, 23 - Jan 28, 25 |
| Hsinchu City, TW | Jul 26, 18 - May 06, 21 |
| Hsinchu, TW | Sep 17, 19 - Jan 30, 25 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 21 |
| G05F: | SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES | 1 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 7 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0035,702 | 2025 | CLOCK CONTROL CIRCUIT AND METHOD | 0 |
| 12211570 | 2025 | Test circuit and method for reading data from a memory device during memory dump | 0 |
| 2024/0353,489 | 2024 | SCAN CLOCK GATING CONTROLLER AND METHOD FOR PERFORMING STUCK-AT FAULT TEST AMONG MULTIPLE BLOCK CIRCUITS | 0 |
| 12044721 | 2024 | Scan chain designing and circuit testing method | 0 |
| 12032020 | 2024 | Calibration data generation circuit and associated method | 0 |
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