Po Shan CHAN
Inventor
Stats
- 1 US patents issued
- 2 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 2 US Applications Filed
- 6 Total Citation Count
- Jun 2, 2022 Most Recent Filing
- Dec 11, 2012 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| NANO AND ADVANCED MATERIALS INSTITUTE LIMITED | 2
| 2012
|
Inventor Addresses
| Address | Duration |
|---|---|
| Hong Kong, CN | Jun 13, 13 - Jan 17, 17 |
| Hong Kong, HK | Aug 29, 24 - Aug 29, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0288,261 | 2024 | BROADBAND PROFILER SYSTEM AND METHOD FOR CONSTRUCTING A THREE-DIMENSIONAL PROFILE OF A TARGET | 0 |
| 9546912 | 2017 | Time temperature indicator by chromatography and photonic lattice changes | 1 |
| 2013/0148,690 | 2013 | TIME TEMPERATURE INDICATOR BY CHROMATOGRAPHY AND PHOTONIC LATTICE CHANGES | 4 |
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