Vladan Blahnik

Inventor

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Work History

Patent OwnerApplications FiledYear
CARL ZEISS SMT GMBH
1
2
2
2
2
4
2
2
1
2005
2006
2007
2008
2009
2010
2011
2014
2016
ASML NETHERLANDS B.V.
2
2006
CARL ZEISS AG
4
1
2012
2017

Inventor Addresses

AddressDuration
Aalen, DEJan 04, 07 - Mar 07, 19
Oberkochen, DEJan 24, 13 - Mar 20, 25

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0093,5922025LIDAR DEVICE FOR SCANNING MEASUREMENT OF A DISTANCE TO AN OBJECT0
120087082024Method and data processing system for creating or adapting individual images based on properties of a light ray within a lens0
2024/0035,8112024MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEM0
2024/0029,3422024METHOD AND DATA PROCESSING SYSTEM FOR SYNTHESIZING IMAGES0
2021/0150,8042021METHOD AND DATA PROCESSING SYSTEM FOR SYNTHESIZING IMAGES7

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