Jingyi Bai
Inventor
Stats
- 20 US patents issued
- 24 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 20 US Patents Issued
- 24 US Applications Filed
- 882 Total Citation Count
- Aug 29, 2022 Most Recent Filing
- Jul 11, 2003 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| APTINA IMAGING CORPORATION | 2
| 2011
|
| ROUND ROCK RESEARCH, LLC | 2
5 2 1 1 1 1 | 2005
2007 2008 2009 2010 2011 2012 |
| CISTA SYSTEM CORP. | 2
| 2016
|
| U.S. BANK NATIONAL ASSOCIATION | 1
1 | 2007
2008 |
| MICRON TECHNOLOGY, INC. | 2
2 3 1 1 1 1 2 2 | 2003
2004 2005 2006 2007 2008 2009 2010 2011 |
Inventor Addresses
| Address | Duration |
|---|---|
| Boise, ID | Jan 03, 06 - Jan 10, 08 |
| Boise, ID, US | Jan 13, 05 - Mar 18, 14 |
| SAN JOSE, CA, US | Nov 10, 16 - Feb 29, 24 |
| San Jose, CA | May 24, 07 - Jun 24, 08 |
| San Jose, CA, US | Mar 01, 07 - Aug 11, 20 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B44C: | PRODUCING DECORATIVE EFFECTS | 3 |
| C23F: | NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES | 1 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0071,846 | 2024 | TEST KEY TRANSISTOR FOR DEEP TRENCH ISOLATION DEPTH DETECTION | 0 |
| 2024/0072,094 | 2024 | CENTRALLY SYMMETRIC VERTICAL TRANSFER GATE | 0 |
| 10741602 | 2020 | Back side illuminated CMOS image sensor arrays | 0 |
| 2018/0097,025 | 2018 | BACK SIDE ILLUMINATED CMOS IMAGE SENSOR ARRAYS | 0 |
| 9876045 | 2018 | Back side illuminated CMOS image sensor arrays | 3 |
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