Shuichi Baba
Inventor
Stats
- 14 US patents issued
- 19 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 14 US Patents Issued
- 19 US Applications Filed
- 176 Total Citation Count
- Mar 28, 2024 Most Recent Filing
- Jan 29, 2004 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
HITACHI, LTD. | 2
2 4 2 6 1 2 1 3 2 | 2004
2005 2006 2007 2008 2009 2010 2011 2012 2013 |
HITACHI KENKI FINE TECH CO., LTD. | 1
| 2008
|
Inventor Addresses
Address | Duration |
---|---|
Hitachi, JP | Mar 03, 11 - Jan 08, 13 |
Tokyo, JP | Jun 01, 06 - Dec 05, 24 |
Tsuchiura-shi, JP | Oct 09, 08 - Oct 09, 08 |
Yokohama, JP | Sep 28, 06 - Oct 02, 14 |
Yokohama-shi, JP | Sep 18, 08 - Sep 18, 08 |
Technology Profile
Technology | Matters | |
---|---|---|
B05B: | SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES | 1 |
B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 2 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 12 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2024/0399,404 | 2024 | PAINTING WORK MANAGEMENT DEVICE, PAINTING WORK MANAGEMENT PROGRAM, AND RAILWAY VEHICLE PAINTED USING PAINTING WORK MANAGEMENT DEVICE | 0 |
2024/0060,880 | 2024 | SPECTROSCOPIC MEASUREMENT DEVICE | 0 |
9417262 | 2016 | Scanning probe microscope and sample observation method using same | 1 |
2015/0377,922 | 2015 | SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME | 3 |
2014/0298,548 | 2014 | SCANNING PROBE MICROSCOPE | 1 |
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