Shuichi Baba

Inventor

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Work History

Patent OwnerApplications FiledYear
HITACHI, LTD.
2
2
4
2
6
1
2
1
3
2
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
HITACHI KENKI FINE TECH CO., LTD.
1
2008

Inventor Addresses

AddressDuration
Hitachi, JPMar 03, 11 - Jan 08, 13
Tokyo, JPJun 01, 06 - Dec 05, 24
Tsuchiura-shi, JPOct 09, 08 - Oct 09, 08
Yokohama, JPSep 28, 06 - Oct 02, 14
Yokohama-shi, JPSep 18, 08 - Sep 18, 08

Technology Profile

Technology Matters
B05B: SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES 1
B82Y: SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES 2
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 12

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0399,4042024PAINTING WORK MANAGEMENT DEVICE, PAINTING WORK MANAGEMENT PROGRAM, AND RAILWAY VEHICLE PAINTED USING PAINTING WORK MANAGEMENT DEVICE0
2024/0060,8802024SPECTROSCOPIC MEASUREMENT DEVICE0
94172622016Scanning probe microscope and sample observation method using same1
2015/0377,9222015SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME3
2014/0298,5482014SCANNING PROBE MICROSCOPE1

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