Nai-Chun An
Inventor
Stats
- 2 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 3 US Applications Filed
- 2 Total Citation Count
- Dec 21, 2018 Most Recent Filing
- Dec 12, 2014 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| METAL INDUSTRIES RESEARCH & DEVELOPMENT CENTRE | 1
2 | 2014
2015 |
Inventor Addresses
| Address | Duration |
|---|---|
| Kaohsiung City, TW | Jun 08, 17 - Jun 25, 20 |
| Kaohsiung, TW | Feb 09, 16 - Feb 09, 21 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01D: | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | 1 |
| G02B: | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10915718 | 2021 | Radio frequency positioning system | 0 |
| 2020/0202,087 | 2020 | RADIO FREQUENCY POSITIONING SYSTEM | 0 |
| 9891428 | 2018 | Optical measurement system, measurement method for errors of rotating platform, and two dimensional sine wave annulus grating | 0 |
| 2017/0160,103 | 2017 | OPTICAL MEASUREMENT SYSTEM, MEASUREMENT METHOD FOR ERRORS OF ROTATING PLATFORM, AND TWO DIMENSIONAL SINE WAVE ANNULUS GRATING | 0 |
| 9255788 | 2016 | Measuring method for linear stage | 2 |
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