Tomoki AMEMIYA
Inventor
Stats
- 0 US patents issued
- 24 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 24 US Applications Filed
- 14 Total Citation Count
- Oct 4, 2024 Most Recent Filing
- Feb 5, 2016 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| HITACHI, LTD. | 1
| 2017
|
Inventor Addresses
| Address | Duration |
|---|---|
| Chiba, JP | Dec 15, 22 - Dec 19, 24 |
| Tokyo, JP | Feb 01, 18 - Apr 10, 25 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 15 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 14 |
| G01V: | GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0114,009 | 2025 | MAGNETIC RESONANCE IMAGING APPARATUS AND IMAGE PROCESSING METHOD | 0 |
| 2025/0116,741 | 2025 | MAGNETIC RESONANCE IMAGING APPARATUS AND IMAGE PROCESSING METHOD | 0 |
| 2025/0117,987 | 2025 | MAGNETIC RESONANCE IMAGING APPARATUS AND IMAGE PROCESSING METHOD | 0 |
| 2025/0117,988 | 2025 | MAGNETIC RESONANCE IMAGING APPARATUS AND IMAGE PROCESSING METHOD | 0 |
| 2025/0085,370 | 2025 | MAGNETIC RESONANCE IMAGING APPARATUS AND METHOD OF DETERMINING SAMPLING PATTERN | 0 |
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