Wha-Keun AHN
Inventor
Stats
- 0 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 4 US Applications Filed
- 2 Total Citation Count
- Jul 23, 2019 Most Recent Filing
- Apr 15, 2016 Earliest Filing
Work History
No Work History Available.Inventor Addresses
| Address | Duration |
|---|---|
| Andong-si, KR | Jan 17, 19 - Oct 20, 20 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
| G02B: | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | 4 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10811145 | 2020 | Plasma diagnosis system using multiple-path Thomson scattering | 0 |
| 10803996 | 2020 | Plasma diagnosis system using multiple-reciprocating-pass Thompson scattering | 0 |
| 2019/0378,625 | 2019 | PLASMA DIAGNOSIS SYSTEM USING MULTIPLE-RECIPROCATING-PASS THOMPSON SCATTERING | 0 |
| 2019/0304,611 | 2019 | PLASMA DIAGNOSIS SYSTEM USING MULTIPLE-PATH THOMSON SCATTERING | 0 |
| 2019/0019,584 | 2019 | PLASMA DIAGNOSIS SYSTEM USING MULTIPLE-RECIPROCATING-PATH THOMPSON SCATTERING | 1 |
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