Ibrahim Abdul-Halim
Inventor
Stats
- 2 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 4 US Applications Filed
- 271 Total Citation Count
- Aug 5, 2013 Most Recent Filing
- Mar 27, 2003 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KLA-TENCOR CORPORATION | 1
| 2003
|
| KLA-TENCOR TECHNOLOGIES CORPORATION | 1
2 2 1 | 2003
2010 2012 2013 |
Inventor Addresses
| Address | Duration |
|---|---|
| Kfar Manda, IL | Jan 08, 04 - Nov 28, 13 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| C23F: | NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2013/0314,710 | 2013 | Methods and Systems for Determining a Critical Dimension and Overlay of a Specimen | 10 |
| 8502979 | 2013 | Methods and systems for determining a critical dimension and overlay of a specimen | 19 |
| 2013/0039,460 | 2013 | METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN | 48 |
| 8179530 | 2012 | Methods and systems for determining a critical dimension and overlay of a specimen | 123 |
| 2010/0271,621 | 2010 | METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN | 21 |
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