Wavecrest Corporation

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8054907 Waveform analyzerExpiredAug 09, 05Nov 08, 11[H04L]
7688927 Method and apparatus for clock recoveryExpiredDec 20, 05Mar 30, 10[H04L]
7305312 Method and apparatus for recording a real time signalExpiredJan 10, 06Dec 04, 07[G01R]
7016805 Method and apparatus for analyzing a distributionExpiredDec 14, 01Mar 21, 06[G06F]
2005/0027,477 Method and apparatus for analyzing measurementsAbandonedAug 25, 04Feb 03, 05[G06F]
2004/0243,889 N-dimensional determination of bit-error ratesAbandonedJan 27, 04Dec 02, 04[G06F]
6813589 Method and apparatus for determining system response characteristicsExpiredNov 29, 01Nov 02, 04[G06F]
6799144 Method and apparatus for analyzing measurementsExpiredJun 27, 01Sep 28, 04[G06F]
2004/0001,194 Electromagnetic and optical analyzerAbandonedOct 21, 02Jan 01, 04[G01N]
2003/0058,970 Method and apparatus for measuring a waveformAbandonedAug 22, 02Mar 27, 03[H04L, H03D]
6449570 Analysis of noise in repetitive waveformsExpiredNov 21, 00Sep 10, 02[H04B, G06F]
2002/0120,420 Method and apparatus for jitter analysisAbandonedOct 25, 01Aug 29, 02[G01D]
6393088 Measurement system with a frequency-dividing edge counterExpiredJan 16, 01May 21, 02[H03K]
6356850 Method and apparatus for jitter analysisExpiredJan 29, 99Mar 12, 02[G01R]
2001/0028,262 Time interval measurement system incorporating a linear ramp generation circuitAbandonedDec 22, 00Oct 11, 01[H03K]
6298315 Method and apparatus for analyzing measurementsExpiredDec 11, 98Oct 02, 01[G06F]
6194925 Time interval measurement system incorporating a linear ramp generation circuitExpiredMar 13, 98Feb 27, 01[H03K]
6185509 Analysis of noise in repetitive waveformsExpiredMar 13, 98Feb 06, 01[H04B, G06F]

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