Verigy Pte. Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2154
 
  
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
  
 
H01P WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE 159
 
  
 
H03F AMPLIFIERS 182
 
  
 
H04B TRANSMISSION 1209

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8384410 Parallel test circuit with active devicesFeb 21, 08Feb 26, 13[G01R]
7213803 Clamp and method for operating sameJan 24, 05May 08, 07[B23Q]
7206710 Incremental generation of calibration factors for automated test equipmentJan 14, 05Apr 17, 07[G06F]
7193854 Using a leaf spring to attach clamp plates with a heat sink to both sides of a component mounted on a printed circuit assemblyMay 02, 05Mar 20, 07[H05K]
7194373 Device testing controlOct 14, 03Mar 20, 07[G06F]
7190217 System, method and apparatus for providing ground separation between different environmentsNov 15, 04Mar 13, 07[H03F]
7190583 Self contained, liquid to air cooled, memory test engineering workstationAug 29, 05Mar 13, 07[H05K]
7184469 Systems and methods for injection of test jitter in data bit-streamsFeb 06, 03Feb 27, 07[H04B]
7180392 Coaxial DC blockJun 01, 04Feb 20, 07[H01P]
7181660 Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under testJul 26, 02Feb 20, 07[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7231573 Delay management systemExpiredDec 20, 02Jun 12, 07[G01R]
7181358 Method, apparatus and database using a map of linked data nodes for storing test numbersExpiredMay 05, 04Feb 20, 07[G06F]

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