VINOTAL GMBH (NOW KNOWN AS RUDOLPH TECHNOLOGIES GERMANY GMBH)

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4202
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 276
 
  
 
B23B TURNING; BORING 151
 
  
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING143
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G03B APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR 196
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0260,631 HOLDING AND ROTATING APPARATUS FOR FLAT OBJECTSOct 06, 14Sep 08, 16[H01L, G01N]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8444126 Holding and turning device for touch-sensitive flat objectsSep 28, 07May 21, 13[B25B]
8289509 Inspection device and inspection method for the optical examination of object surfaces, particularly of wafer surfacesJan 27, 10Oct 16, 12[G03B]
7284760 Holding device for disk-shaped objectsAug 06, 04Oct 23, 07[B23B]
7030401 Modular substrate measurement systemApr 12, 01Apr 18, 06[G01N]
6954267 Device for measuring surface defectsSep 09, 02Oct 11, 05[G01N]
6935201 Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locationsAug 11, 03Aug 30, 05[G01M]
6633372 Method for inspection of an analyzed surface and surface scanning analyzerMay 30, 01Oct 14, 03[G01N]
6420864 Modular substrate measurement systemApr 13, 00Jul 16, 02[G01R]
6268915 MicropolarimeterFeb 03, 00Jul 31, 01[G01J]
5502567 Micropolarimeter, microsensor system and method of characterizing thin filmsJun 28, 94Mar 26, 96[G01J]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6891609 Measurement box with module for measuring wafer characteristicsExpiredApr 11, 02May 10, 05[G01N]
6798513 Measuring moduleExpiredApr 11, 02Sep 28, 04[G01J]

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