VERIGY (SINGAPORE) PTE LTD

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H03K PULSE TECHNIQUE 3128
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
F15B SYSTEMS ACTING BY MEANS OF FLUIDS IN GENERAL; FLUID-PRESSURE ACTUATORS, e.g. SERVOMOTORS; DETAILS OF FLUID-PRESSURE SYSTEMS, NOT OTHERWISE PROVIDED FOR 144
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7984114 Direct access to content and services available on an entertainment systemFeb 07, 05Jul 19, 11[H04N, G06F]
7493294 Mutually adaptive systemsMar 13, 07Feb 17, 09[G06F]
6912946 System and method for improved controlled airflow within a vacuum booster systemMay 28, 03Jul 05, 05[F15B]
6576512 Method of manufacturing an EEPROM deviceSep 23, 02Jun 10, 03[H01L]
5289116 Apparatus and method for testing electronic devicesSep 28, 92Feb 22, 94[G01R]
5266844 Timing discriminator circuit and method for determining the arrival order of input signalsJul 15, 91Nov 30, 93[H03K]
5237221 On-chip pull-up circuit which may be selectively disabledNov 25, 91Aug 17, 93[H03K]
5192876 Flat pulse generatorAug 16, 91Mar 09, 93[H03K]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0255,098 CLAMP WITH A NON-LINEAR BIASING MEMBERAbandonedApr 11, 08Oct 15, 09[F16B]
7555639 Method for configuring a data formatting process using configuration values of a highest priority for each of a number of configuration keys storing in several configuration layersExpiredJan 31, 06Jun 30, 09[G06F]
2009/0138,761 System and method for electronic testing of devicesAbandonedNov 28, 07May 28, 09[G06F]
2008/0306,786 License management tool to monitor and analyze license usage to determine need for additional licensesAbandonedJun 05, 07Dec 11, 08[G06Q, G06F]
2008/0282,192 METHOD AND APPARATUS FOR SELECTING AND DISPLAYING A NUMBER OF TEST DATA ITEMSAbandonedMay 07, 07Nov 13, 08[G06F]
2008/0282,226 METHODS AND APPARATUS FOR DISPLAYING A DYNAMICALLY UPDATED SET OF TEST DATA ITEMS DERIVED FROM VOLATILE OR NONVOLATILE STORAGEAbandonedMay 07, 07Nov 13, 08[G06F]
2008/0270,401 Method and Apparatus for Displaying Sorted Test Data EntriesAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,835 Methods and Apparatus for Displaying Test Results and AlertsAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,845 Methods and Apparatus That Enable a Viewer to Distinguish Different Test Data Entries and Test Data ItemsAbandonedApr 26, 07Oct 30, 08[G06F, G07F]
2008/0270,846 Methods and Apparatus for Compiling and Displaying Test Data ItemsAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,847 Methods and Apparatus for Displaying Production and Debug Test DataAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,848 Method and Apparatus for Displaying Pin Result DataAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,898 Methods and Apparatus for Dynamically Updating a Graphical User Interface, to Focus on a Production Display or a Debug DisplayAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0270,923 Method and Apparatus for Displaying Test DataAbandonedApr 26, 07Oct 30, 08[G06F]
2008/0235,542 Electronic testing device for memory devices and related methodsAbandonedMar 22, 07Sep 25, 08[G01R]
7421360 Method and apparatus for handling a user-defined event that is generated during test of a deviceExpiredJan 31, 06Sep 02, 08[G06F]
2008/0209,441 Context-driven dynamic subscription based on user selectionsAbandonedFeb 27, 07Aug 28, 08[G06F]
7403874 Method and system for prioritizing formatting actions of a number of data formattersExpiredJan 31, 06Jul 22, 08[G06F]
2008/0169,730 Inverted mesa quartz crystal time base reference for automatic test equipmentAbandonedJan 11, 07Jul 17, 08[H01L]
2008/0162,992 Method and apparatus for intelligently re-sequencing tests based on production test resultsAbandonedDec 27, 06Jul 03, 08[G06F]

View all patents..

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.