UNIVERSITÄT BASEL

Patent Owner

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]315
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
B81B MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES 132
 
  
 
G01G WEIGHING 127

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0023,611 ATOMIC FORCE MICROSCOPE MEASURING DEVICEFeb 17, 15Jan 26, 17[G01N, G01Q, G02B]
2016/0178,658 SAMPLE HOLDER FOR AN AFMAug 06, 14Jun 23, 16[G01Q]

Recent Patents

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Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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