UNITEST INC.

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G11C STATIC STORES 12139
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 11148
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 8439
 
  
 
F21S NON-PORTABLE LIGHTING DEVICES OR SYSTEMS THEREOF 155
 
  
 
F21V FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR 1109
 
  
 
F21W INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21L, F21S and F21V, RELATING TO USES OR APPLICATIONS OF LIGHTING DEVICES OR SYSTEMS 117
 
  
 
F21Y INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21L, F21S and F21V, RELATING TO THE FORM OF THE LIGHT SOURCES 134
 
  
 
H03K PULSE TECHNIQUE 1130
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2015/0039,264 DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAMMABLE LOGICJul 30, 14Feb 05, 15[G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9714977 Burn-in test system and methodSep 16, 15Jul 25, 17[G01R]
9613718 Detection system for detecting fail block using logic block address and data buffer address in a storage testerAug 07, 14Apr 04, 17[G06F, G11C]
9459302 Device under test tester using redriverJun 19, 13Oct 04, 16[G01R]
9411700 Storage tester capable of individual control for a plurality of storageAug 07, 14Aug 09, 16[G06F, G11C]
9378845 System for simultaneously determining memory test resultJul 30, 14Jun 28, 16[G11C]
9378846 Non-mounted storage test device based on FPGAAug 07, 14Jun 28, 16[G06F, G11C]
9312030 Apparatus and method for acquiring data of fast fail memoryJul 30, 14Apr 12, 16[G06F, G11C]
9245613 Storage interface apparatus for solid state drive testerJun 19, 13Jan 26, 16[G06F, G11C]
9197212 Apparatus and method for correcting output signal of FPGA-based memory test deviceJul 30, 14Nov 24, 15[H03K, G06F]
9171643 Solid state drive testerJun 19, 13Oct 27, 15[G06F, G11C]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0040,639 Apparatus and Method For Generating Test Pattern Data For Testing Semiconductor DeviceAbandonedJul 30, 07Feb 14, 08[G01R]
2008/0034,265 Tester For Testing Semiconductor DeviceAbandonedJul 25, 07Feb 07, 08[G06F]
6883128 PC and ATE integrated chip test equipmentExpiredAug 08, 02Apr 19, 05[G06F]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.