Tropel Corporation

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS396
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
G01C MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 1104
 
  
 
G01F MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 158
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6560039 Double mirror catadioptric objective lens system with three optical surface multifunction componentSep 26, 00May 06, 03[G02B]
5757493 Interferometer with catadioptric imaging system having expanded range of numerical apertureOct 16, 96May 26, 98[G01B]
5650877 Imaging system for deep ultraviolet lithographyAug 14, 95Jul 22, 97[G02B]
5416586 Method of testing aspherical optical surfaces with an interferometerOct 15, 93May 16, 95[G01B]
5349434 Method of measuring artifact taperMar 24, 93Sep 20, 94[G01C, G01B, G01F]
5220590 X-ray projection lithography cameraMay 05, 92Jun 15, 93[G21K]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6456384 Moire interferometer with overlapping illumination and imaging systemsExpiredNov 09, 00Sep 24, 02[G01B]
6191887 Laser illumination with speckle reductionExpiredJan 07, 00Feb 20, 01[G02B]
6043886 Interferometric method of measuring toric surfaces at grazing incidence with phase shiftingExpiredSep 02, 99Mar 28, 00[G01B]
5991035 Interferometric method of measuring toric surfaces at grazing incidenceExpiredFeb 08, 99Nov 23, 99[G01B]
5982475 Raster-scan photolithographic reduction systemExpiredSep 30, 97Nov 09, 99[G03B]
5923425 Grazing incidence interferometry for measuring transparent plane-parallel platesExpiredNov 20, 97Jul 13, 99[G01B]
5909281 Interferometric measurement of surfaces with diffractive optics and planar wavefront imagingExpiredJun 30, 97Jun 01, 99[G01B]
5909282 Interferometer for measuring thickness variations of semiconductor wafersExpiredMay 30, 97Jun 01, 99[G01B]
5889591 Interferometric measurement of toric surfaces at grazing incidenceExpiredOct 17, 96Mar 30, 99[G01B]
5793488 Interferometer with compound optics for measuring cylindrical objects at oblique incidenceExpiredJul 31, 95Aug 11, 98[G01B]
5777738 Interferometric measurement of absolute dimensions of cylindrical surfaces at grazing incidenceExpiredMar 17, 97Jul 07, 98[G01B]
5724137 Fringe pattern discriminator for interferometer using diffraction gratingsExpiredJun 27, 96Mar 03, 98[G01B]
5719676 Diffraction management for grazing incidence interferometerExpiredApr 12, 96Feb 17, 98[G01B]
5684594 Object fixturing in interferometerExpiredApr 18, 96Nov 04, 97[G01B]
5654798 Interferometric measurement of surfaces with diffractive optics at grazing incidenceExpiredJun 07, 95Aug 05, 97[G01B]
5532821 Testing of recessed surfaces at grazing incidenceExpiredMar 16, 95Jul 02, 96[G01B]
5353322 Lens system for X-ray projection lithography cameraExpiredMay 20, 93Oct 04, 94[G21K]
4325637 Phase modulation of grazing incidence interferometerExpiredJun 02, 80Apr 20, 82[G01B]
4277141 Multifaceted mirror and assembly fixture and method of making such mirrorExpiredJan 31, 80Jul 07, 81[B29D, G02B]

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