The Royal Institution of the Advancement of Learning/McGill University

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]117

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9671424 Methods and systems for optimizing frequency modulation atomic force microscopyMar 13, 13Jun 06, 17[G01Q]

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