TERAVIEW LIMITED

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1266
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 10196
 
  
 
A61B DIAGNOSIS; SURGERY; IDENTIFICATION 5235
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
  
 
H01Q AERIALS 2108
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G06G ANALOGUE COMPUTERS 152
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9829433 Imaging techniques and associated apparatusJan 12, 04Nov 28, 17[G01N, G06G]
9201052 Analysis apparatus and methodJan 29, 08Dec 01, 15[G01J, G01N]
9075002 TeraHertz probe array imaging systemFeb 11, 05Jul 07, 15[G01N]
9006660 Scanning terahertz probeAug 28, 08Apr 14, 15[G01J, G01N, A61B]
8665423 Method and apparatus for investigating a non-planar sampleAug 27, 04Mar 04, 14[G01J]
8399838 Terahertz investigative system and methodJan 23, 09Mar 19, 13[G01J]
8373126 Apparatus and method for investigating a sampleJul 13, 10Feb 12, 13[G01J, G01N]
8138477 THz investigation apparatus and methodMay 18, 07Mar 20, 12[G01J]
8027709 Radiation probe and detecting tooth decayDec 14, 04Sep 27, 11[A61B, A61C]
7804069 Imaging apparatus and methodSep 19, 05Sep 28, 10[G01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0108,889 METHOD AND APPARATUS FOR IMAGING AN LCD USING TERAHERTZ TIME DOMAIN SPECTROSCOPYAbandonedJan 29, 08May 06, 10[G01J, G01R]
2008/0037,031 Terahertz Time Domain Sensing to Derive Physical Characteristics of an Object by Evaluating the Contribution of Surface Waves to the Reflected/Scattered Time Domain WaveformAbandonedJul 08, 05Feb 14, 08[G01N, G01B]
2006/0153,262 Terahertz quantum cascade laserAbandonedOct 10, 02Jul 13, 06[H01S]
6958853 Magnetically enhanced radiation sourceExpiredSep 27, 00Oct 25, 05[G02F]
6865014 Apparatus and method for investigating a sampleExpiredJan 28, 03Mar 08, 05[G01N, G02F]
2003/0155,512 Apparatus and method for investigating a sampleAbandonedMar 24, 03Aug 21, 03[G01N]

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