SV Probe Pte. Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6153
 
 
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 254
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 2131
 
 
 
H01K ELECTRIC INCANDESCENT LAMPS 121
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8004299 Cantilever probe structure for a probe card assemblyMar 01, 11Aug 23, 11[G01R]
7898276 Probe card with stacked substrateFeb 21, 06Mar 01, 11[G01R]
7721430 Approach for fabricating cantilever probesFeb 21, 07May 25, 10[H01R]
7675302 Probe card assembly and method of attaching probes to the probe card assemblyAug 16, 07Mar 09, 10[G01R]
7637006 Beam assembly method for large area array multi-beam DUT probe cardsFeb 27, 07Dec 29, 09[G01R, H05K]
7637007 Approach for fabricating cantilever probes for probe card assembliesFeb 07, 07Dec 29, 09[H01L, H01K, B23P]
7637009 Approach for fabricating probe elements for probe card assemblies using a reusable substrateFeb 26, 07Dec 29, 09[H01R]
7583098 Automated probe card planarization and alignment methods and toolsFeb 07, 07Sep 01, 09[G01R]
7495459 Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probesAug 10, 07Feb 24, 09[G01R]
7437813 Probe repair methodsFeb 07, 07Oct 21, 08[B23P]

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Expired/Abandoned/Withdrawn Patents

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