SILTRON INC.
Patent Owner
Stats
- 53 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Dec 15, 2015 most recent publication
Details
- 53 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 534 Total Citation Count
- Dec 22, 2000 Earliest Filing
- 31 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Top Patents (by citation)
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Recent Publications
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Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9211631 Grinding wheel truing tool and manufacturing method thereof, and truing apparatus, method for manufacturing grinding wheel and wafer edge grinding apparatus using the sameApr 09, 12Dec 15, 15[B24B, B24D]
8821219 Wafer unloading system and wafer processing equipment including the sameJan 18, 11Sep 02, 14[B24B]
8753445 Apparatus for growing high quality silicon single crystal ingot and growing method using the sameJul 05, 07Jun 17, 14[C30B]
8574362 Method and apparatus for manufacturing an ultra low defect semiconductor single crystalline ingotOct 02, 08Nov 05, 13[C30B]
8398464 Grinding wheel truing tool and manufacturing method thereof, and truing apparatus, method for manufacturing grinding wheel and wafer edge grinding apparatus using the sameDec 10, 08Mar 19, 13[B24B]
8349075 2-dimensional line-defects controlled silicon ingot, wafer and epitaxial wafer, and manufacturing process and apparatus thereforDec 16, 11Jan 08, 13[C30B]
8298926 Silicon wafer with controlled distribution of embryos that become oxygen precipitates by succeeding annealing and its manufacturing methodDec 27, 07Oct 30, 12[H01L, C03B]
8216372 Apparatus for growing high quality silicon single crystal ingot and growing method using the sameFeb 13, 06Jul 10, 12[C30B]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2012/0141,808 2-DIMENSIONAL LINE-DEFECTS CONTROLLED SILICON INGOT, WAFER AND EPITAXIAL WAFER, AND MANUFACTURING PROCESS AND APPARATUS THEREFORAbandonedDec 16, 11Jun 07, 12[C01B, B28D, C30B, B32B]
2011/0309,051 APPARATUS AND METHOD FOR WET TREATMENT OF AN OBJECT AND FLUID DIFFUSION PLATE AND BARREL USED THEREINAbandonedNov 03, 09Dec 22, 11[B08B, C23F]
2011/0246,697 SINGLE-HOST MULTI-WORKSTATION COMPUTER SYSTEM, ITS EQUIPMENT CONFIGURATION METHOD AND WORKSTATION CARDAbandonedOct 21, 09Oct 06, 11[G06F]
2011/0079,175 IMAGE SENSOR AND METHOD FOR MANUFACTURING THE SAMEAbandonedOct 06, 10Apr 07, 11[C03B, C30B]
2010/0158,781 METHOD AND APPARATUS FOR GROWING HIGH QUALITY SILICON SINGLE CRYSTAL, SILICON SINGLE CRYSTAL INGOT GROWN THEREBY AND WAFER PRODUCED FROM THE SAME SINGLE CRYSTAL INGOTAbandonedFeb 24, 09Jun 24, 10[C01B]
2010/0040,525 Method and Apparatus of Growing Silicon Single Crystal and Silicon Wafer Fabricated TherebyAbandonedFeb 11, 09Feb 18, 10[C01B]
2009/0272,948 High Quality Single Crystal and Method of Growing the SameAbandonedJul 02, 08Nov 05, 09[C01B, H01B, C01G]
2009/0183,670 APPARATUS FOR MANUFACTURING HIGH-QUALITY SEMICONDUCTOR SINGLE CRYSTAL INGOT AND METHOD USING THE SAMEAbandonedJan 20, 09Jul 23, 09[C30B]
2009/0148,982 Method of Manufacturing Compound Semiconductor DevicesAbandonedJan 21, 09Jun 11, 09[H01L]
2009/0149,118 Silicon Wafer Grinding Apparatus, Retaining Assembly Used for the Same and Silicon Wafer Flatness Correcting MethodAbandonedDec 08, 08Jun 11, 09[B24B]
2009/0142,991 Silicon Wafer Grinding Apparatus, Retaining Assembly Used for the Same and Silicon Wafer Flatness Correcting MethodAbandonedDec 08, 08Jun 04, 09[B24B]
2008/0290,347 Gallium Nitride Semiconductor and Method of Manufacturing the SameAbandonedMay 20, 08Nov 27, 08[H01L]
2008/0206,992 Method for manufacturing high flatness silicon waferAbandonedDec 27, 07Aug 28, 08[H01L]
2008/0156,430 Apparatus and method for mounting silicon ingot to mounterAbandonedDec 11, 07Jul 03, 08[B29C]
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