SIGRAY, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 10196
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 8120
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 739
 
  
 
A61B DIAGNOSIS; SURGERY; IDENTIFICATION 3237
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0162,288 X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITYFeb 14, 17Jun 08, 17[H01J, G21K]
2016/0064,175 STRUCTURED TARGETS FOR X-RAY GENERATIONAug 29, 14Mar 03, 16[H01J, G03F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9874531 X-ray method for the measurement, characterization, and analysis of periodic structuresMay 15, 15Jan 23, 18[H01J, G21K, G01N, A61B]
9823203 X-ray surface analysis and measurement apparatusMar 03, 16Nov 21, 17[H01J, G21K, G01N]
9719947 X-ray interferometric imaging systemApr 29, 15Aug 01, 17[H01J, G21K, G01N, A61B]
9594036 X-ray surface analysis and measurement apparatusMar 01, 15Mar 14, 17[H01J, G21K, G01N, G01B]
9570265 X-ray fluorescence system with high flux and high flux densitySep 19, 16Feb 14, 17[H01J, G01N]
9543109 X-ray sources using linear accumulationApr 01, 16Jan 10, 17[H01J, G21K]
9448190 High brightness X-ray absorption spectroscopy systemMar 03, 15Sep 20, 16[H01J, G01N]
9449781 X-ray illuminators with high flux and high flux densityDec 08, 14Sep 20, 16[H01J, G21K, G01N]
9390881 X-ray sources using linear accumulationSep 19, 14Jul 12, 16[H01J, G21K]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0117,599 X-RAY INTERFEROMETRIC IMAGING SYSTEMAbandonedOct 29, 14Apr 30, 15[A61B]
2015/0092,924 STRUCTURED TARGETS FOR X-RAY GENERATIONAbandonedAug 21, 14Apr 02, 15[H01J]

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