SEMILAB FELVEZETO FIZIKAI LABORATORIUM RT

Patent Owner

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6653850 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductorsOct 05, 01Nov 25, 03[G01R]
5406214 Method and apparatus for measuring minority carrier lifetime in semiconductor materialsDec 16, 91Apr 11, 95[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5202018 Process for electrochemical dissolution of semiconductorsExpiredJul 11, 91Apr 13, 93[C25F]

Top Inventors for This Owner

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