SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 257163
 
  
 
G11C STATIC STORES 22129
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 10437
 
  
 
H03K PULSE TECHNIQUE 8123
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 7152
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 4100
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 496
 
  
 
H03H IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS 467
 
  
 
B81C PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 329
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 377

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0068,880 DIE SORTING APPARATUS AND DIE SORTING METHODAug 25, 17Mar 08, 18[H01L]
2018/0068,961 PROTECTION CIRCUIT AND INTEGRATED CIRCUITAug 29, 17Mar 08, 18[H01L]
2018/0061,714 SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOFAug 16, 17Mar 01, 18[H01L]
2018/0061,716 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOFAug 18, 17Mar 01, 18[H01L]
2018/0061,846 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOFAug 22, 17Mar 01, 18[H01L]
2018/0047,623 SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOFAug 02, 17Feb 15, 18[H01L]
2018/0047,632 SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOFAug 09, 17Feb 15, 18[H01L]
2018/0040,604 DIODE DESIGN OF FINFET DEVICEMay 23, 17Feb 08, 18[H01L]
2018/0040,605 ELECTROSTATIC DISCHARGE PROTECTION DEVICE AND METHODJul 25, 17Feb 08, 18[H01L]
2018/0012,797 METHOD FOR REDUCING VIA RC DELAYJun 16, 17Jan 11, 18[H01L]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9919918 Wafer-level bonding packaging method and wafer structureJul 19, 16Mar 20, 18[B81C, B81B]
9922980 Method and device for reducing FinFET self-heating effectSep 29, 16Mar 20, 18[H01L]
9922985 Semiconductor memory device and fabrication method thereofMar 08, 17Mar 20, 18[H01L]
9923027 Structure and method for memory cell arrayJun 16, 17Mar 20, 18[H01L]
9923065 Fabricating method of fin-type semiconductor deviceJul 18, 16Mar 20, 18[H01L]
9923100 Flash memory structure and fabrication method thereofMar 08, 17Mar 20, 18[H01L]
9917030 Semiconductor structure and fabrication method thereofJan 09, 17Mar 13, 18[H01L]
9911593 NAND flash memory and fabrication methods thereofAug 23, 16Mar 06, 18[H01L]
9911832 Method to improve gate dielectric quality for FinFETAug 12, 16Mar 06, 18[H01L]
9911833 Semiconductor structures and fabrication methods thereofOct 26, 16Mar 06, 18[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0311,125 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEAbandonedJan 09, 15Oct 29, 15[H01L]
2015/0169,820 WEAK POINTS AUTO-CORRECTION PROCESS FOR OPC TAPE-OUTAbandonedSep 30, 14Jun 18, 15[G06F]
2015/0041,948 SEMICONDUCTOR DEVICE INCLUDING STI STRUCTURE AND METHOD FOR FORMING THE SAMEAbandonedJul 29, 14Feb 12, 15[H01L]
2011/0171,585 Photolithography MethodAbandonedMay 14, 10Jul 14, 11[G03F]
2011/0156,123 METHOD FOR MANUFACTURING TWIN BIT STRUCTURE CELL WITH HAFNIUM OXIDE LAYERAbandonedDec 23, 10Jun 30, 11[H01L]
2011/0161,030 Method And Device For Monitoring Measurement Data In Semiconductor ProcessAbandonedDec 22, 10Jun 30, 11[G06F]
2011/0140,192 METHOD FOR MANUFACTURING TWIN BIT STRUCTURE CELL WITH FLOATING POLYSILICON LAYERAbandonedDec 15, 10Jun 16, 11[H01L]
2011/0108,889 SEMICONDUCTOR DEVICE WITH A 7F2 CELL STRUCTUREAbandonedNov 02, 10May 12, 11[H01L]
2011/0109,340 Interface Adapter For Connecting With A Test ProbeAbandonedMay 26, 10May 12, 11[G01R]
2011/0109,856 METHOD AND STRUCTURE FOR ELECTRO-PLATING ALUMINUM SPECIES FOR TOP METAL FORMATION OF LIQUID CRYSTAL ON SILICON DISPLAYSAbandonedNov 02, 10May 12, 11[H01L, G02F]
2011/0095,396 METHOD AND STRUCTURE FOR SILICON NANOCRYSTAL CAPACITOR DEVICES FOR INTEGRATED CIRCUITSAbandonedSep 21, 10Apr 28, 11[H01L]
2011/0074,459 STRUCTURE AND METHOD FOR SEMICONDUCTOR TESTINGAbandonedSep 21, 10Mar 31, 11[H01L, G01R]
2011/0069,261 METHOD AND RESULTING STRUCTURE USING SILVER FOR LCOS DEVICESAbandonedNov 30, 10Mar 24, 11[H01L, G02F]
2011/0018,608 Bipolar Transistor, Band-Gap Reference Circuit and Virtual Ground Reference CircuitAbandonedJul 23, 10Jan 27, 11[H03K, H01L, G05F]
2011/0012,613 Failure Detection Method and Failure Detection ApparatusAbandonedJul 14, 10Jan 20, 11[G01R]
2011/0000,509 PHOTORESIST TOOL CLEANING JIG CONFIGURED TO RECEIVE FLOW FROM TOP AND BOTTOMAbandonedOct 27, 08Jan 06, 11[B08B]
2010/0165,165 METHOD AND DEVICE FOR A CMOS IMAGE SENSORAbandonedOct 20, 09Jul 01, 10[H04N]
2010/0153,622 Data Access Controller and Data Accessing MethodAbandonedJan 29, 09Jun 17, 10[G06F]
2010/0037,952 Selective Emitter Solar Cell and Fabrication Method ThereofAbandonedAug 15, 09Feb 18, 10[H01L]
2009/0289,337 Lead FrameAbandonedAug 05, 09Nov 26, 09[H01L]

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