RENESAS SEMICONDUCTOR MANUFACTURING CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 8151
 
  
 
G11C STATIC STORES 6145
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 6356
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 4443
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6993696 Semiconductor memory device with built-in self test circuit operating at high rateNov 15, 00Jan 31, 06[G01R]
6990614 Data storage apparatus and data measuring apparatusAug 18, 00Jan 24, 06[G06F]
6900627 Apparatus and method for testing semiconductor integrated circuitAug 13, 01May 31, 05[G01R]
6788990 Process control device and process control methodSep 07, 00Sep 07, 04[G06F]
6724668 Semiconductor device provided with memory chipsMay 08, 02Apr 20, 04[G11C]
6714888 Apparatus for testing semiconductor integrated circuitAug 13, 01Mar 30, 04[G01R]
6708302 Semiconductor moduleMay 12, 00Mar 16, 04[G01R]
6690189 Apparatus and method for testing semiconductor integrated circuitAug 13, 01Feb 10, 04[G01R]
6661248 Tester for semiconductor integrated circuitsMay 15, 02Dec 09, 03[G01R]
6651023 Semiconductor test apparatus, and method of testing semiconductor deviceAug 13, 01Nov 18, 03[G06F]

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Expired/Abandoned/Withdrawn Patents

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