POWERCHIP TECHNOLOGY CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 78284
 
  
 
G11C STATIC STORES 38113
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 8439
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 5154
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 397
 
  
 
H03K PULSE TECHNIQUE 3128
 
  
 
G05B CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 299
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 2133
 
  
 
H02M APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF 2100
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 2109

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0242,331 PHASE SHIFT MASK AND MANUFACTURING METHOD THEREOFApr 21, 16Aug 24, 17[G03F]
2016/0216,313 TRANSISTOR TESTING CIRCUIT AND METHOD THEREOF, SEMICONDUCTOR MEMORY APPARATUS AND SEMICONDUCTOR APPARATUSJun 17, 15Jul 28, 16[G01R]
2016/0047,045 PROCESS CONTROL METHOD AND PROCESS CONTROL SYSTEMOct 31, 14Feb 18, 16[C23C, G05B, G06F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9904660 Nonparametric method for measuring clustered level of time rank in binary dataNov 10, 16Feb 27, 18[G06F]
9899436 Image sensor and related fabrication methodOct 26, 16Feb 20, 18[H01L]
9864363 Process control method and process control systemOct 31, 14Jan 09, 18[G05B]
9865327 Semiconductor memory apparatusMar 28, 17Jan 09, 18[G11C]
9842870 Integrated bio-sensor with nanocavity and fabrication method thereofJun 03, 17Dec 12, 17[H01L, G01N]
9811899 Method, image processing system and computer-readable recording medium for item defect inspectionApr 15, 16Nov 07, 17[G06T]
9780195 Non-volatile memory and fabricating method thereofMar 04, 15Oct 03, 17[H01L]
9735228 Multilayer crown-shaped MIM capacitor and manufacturing method thereofJan 03, 16Aug 15, 17[H01L]
9709335 Dispatch control method for furnace processOct 09, 14Jul 18, 17[H01L, G05B, G06F, F27D]
9704579 Non-valatile semiconductor memory device and location based erasure methodsJul 26, 16Jul 11, 17[G11C]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0270,996 SEMICONDUCTOR MEMORY DEIVCE AND ACCESSING METHOD THEREOFAbandonedAug 10, 16Sep 21, 17[G11C]
2017/0206,972 LATCH CIRCUIT AND SEMICONDUCTOR MEMORY DEVICEAbandonedAug 25, 16Jul 20, 17[G11C]
2017/0176,671 LIGHT PIPE STRUCTURE OF IMAGE SENSING DEVICE AND FABRICATING METHOD THEREOFAbandonedFeb 04, 16Jun 22, 17[H01L, G02B]
2017/0115,340 VOLTAGE CALIBRATION CIRCUIT CAPABLE OF UPDATING VOLTAGE TO BE CALIBRATED AUTOMATICALLYAbandonedJan 06, 16Apr 27, 17[H03K, G01R, G05F]
2017/0018,595 METHOD OF FABRICATING LIGHT PIPE OF IMAGE SENSING DEVICEAbandonedOct 29, 15Jan 19, 17[H01L]
2017/0012,080 METHOD OF FABRICATING SEMICONDUCTOR DEVICEAbandonedSep 16, 15Jan 12, 17[H01L]
2016/0284,713 SEMICONDUCTOR MEMORY DEVICEAbandonedSep 03, 15Sep 29, 16[H01L]
2016/0211,209 SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING THE SAMEAbandonedMar 30, 15Jul 21, 16[H01L]
2016/0181,267 NON-VOLATILE MEMORY CELL, NAND-TYPE NON-VOLATILE MEMORY, AND METHOD OF MANUFACTURING THE SAMEAbandonedMar 12, 15Jun 23, 16[H01L]
2016/0163,552 NON-VOLATILE MEMORY AND FABRICATING METHOD THEREOFAbandonedFeb 13, 15Jun 09, 16[H01L]
2016/0126,282 CMOS IMAGE SENSOR WITH ENHANCED DYNAMIC RANGEAbandonedNov 25, 14May 05, 16[H01L]
2016/0118,433 SEMICONDUCTOR FABRICATION METHODAbandonedDec 16, 14Apr 28, 16[H01L]
2016/0119,247 AUTOMATIC RESOURCE DELIVERING APPARATUS AND METHOD THEREOFAbandonedDec 26, 14Apr 28, 16[H04L]
2016/0111,295 METHOD FOR FABRICATING SEMICONDUCTOR DEVICEAbandonedDec 11, 14Apr 21, 16[H01L]
2016/0099,279 IMAGE SENSOR WITH DEEP WELL STRUCTURE AND FABRICATION METHOD THEREOFAbandonedNov 20, 14Apr 07, 16[H01L]
2016/0043,032 MEMORY CIRCUIT STRUCTURE AND SEMICONDUCTOR PROCESS FOR MANUFACTURING THE SAMEAbandonedOct 08, 15Feb 11, 16[H01L]
2016/0035,733 SEMICONDUCTOR CIRCUIT STRUCTUREAbandonedOct 12, 15Feb 04, 16[H01L]
2015/0371,862 METHOD OF FORMING PATTERNAbandonedSep 26, 14Dec 24, 15[H01L]
2015/0340,427 CAPACITOR STRUCTURE AND METHOD OF MANUFACTURING THE SAMEAbandonedSep 26, 14Nov 26, 15[H01L]
2015/0325,441 SEMICONDUCTOR FABRICATION METHODAbandonedOct 09, 14Nov 12, 15[H01L]

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