PHILIPS ELECTRON OPTICS B.V.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6455848 Particle-optical apparatus involving detection of Auger electronicsDec 15, 99Sep 24, 02[H01J, G21K, G01N]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7173999 X-ray microscope having an X-ray source for soft X-rayExpiredDec 19, 00Feb 06, 07[G21K]
6690009 Method of determining the charge carrier concentration in materials, notably semiconductorsExpiredOct 12, 00Feb 10, 04[H01L]

Top Inventors for This Owner

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