PETER WOLTERS GMBH
Patent Owner
Stats
- 11 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Jan 10, 2017 most recent publication
Details
- 11 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 233 Total Citation Count
- Dec 10, 1996 Earliest Filing
- 16 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
Upgrade to the Professional Level to View Top Patents for this Owner. Learn More |
Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9539695 Carrier, method for coating a carrier, and method for the simultaneous double-side material-removing machining of semiconductor wafersOct 01, 08Jan 10, 17[B24B]
9004981 Apparatus for double-sided, grinding machining of flat workpiecesNov 18, 09Apr 14, 15[B24B, B24D]
8512099 Method for the simultaneous double-sided material removal processing of a plurality of semiconductor wafersOct 19, 09Aug 20, 13[B24B]
8113913 Method for the simultaneous grinding of a plurality of semiconductor wafersMar 14, 08Feb 14, 12[B24B]
7815489 Method for the simultaneous double-side grinding of a plurality of semiconductor wafersJul 09, 07Oct 19, 10[B24B]
6843704 Method and apparatus for automatically loading a double-sided polishing machine with wafer crystalsJul 08, 02Jan 18, 05[B24B]
6447382 Apparatus for removing semiconductor wafers from within the runner disks of a double-sided polishing machineSep 25, 00Sep 10, 02[B24B]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2012/0293,811 Device and Method for Determining the Position of a Working Surface of a Working DiscAbandonedJan 07, 11Nov 22, 12[G01B]
2012/0220,197 Device and Method for the Double-Sided Processing of Flat Work PiecesAbandonedOct 28, 10Aug 30, 12[B24B]
2012/0052,771 Method For the Material-Removing Machining of Very Thin Work Pieces in a Double Sided Grinding MachineAbandonedApr 01, 10Mar 01, 12[B24B]
2011/0222,071 METHOD FOR MEASURING THE THICKNESS OF A DISCOIDAL WORKPIECEAbandonedAug 29, 09Sep 15, 11[G01B]
7963823 Machining machine with means for acquiring machining parametersExpiredMar 12, 08Jun 21, 11[B24B]
2008/0217,310 METHOD FOR PROFILING THE PERIMETER BORDER OF A SEMICONDUCTOR WAFERAbandonedJun 05, 07Sep 11, 08[B23K]
6866468 Loading and unloading station for a device for the processing of circular flat work-pieces, especially semiconductor wafersExpiredMar 13, 02Mar 15, 05[B65G]
6780083 Apparatus and method for the chemical mechanical polishing of the surface of circular flat workpieces, in particular semi-conductor wafersExpiredApr 19, 02Aug 24, 04[B24B]
6767276 Holder for flat workpieces, particularly semiconductor wafersExpiredDec 13, 01Jul 27, 04[B24B]
6709323 Holder for flat workpieces, particularly semiconductor wafersExpiredDec 13, 01Mar 23, 04[B24B]
6669540 Chuck means for flat workpieces, in particular semi-conductor wafersExpiredMar 28, 02Dec 30, 03[B24B]
6093091 Holder for flat subjects in particular semiconductor wafersExpiredDec 08, 98Jul 25, 00[B24B]
6050885 Device for the chemical-mechanical polishing of an object, in particular a semiconductor waferExpiredApr 27, 98Apr 18, 00[B24B]
Top Inventors for This Owner
Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More |
We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.