Oy Mapvision Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7733503 Method and system for optical measurement of the shape of an articleNov 21, 05Jun 08, 10[G01B]
7609374 Method and system for determining the properties of a surface of revolutionOct 27, 05Oct 27, 09[G01N]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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