ORBOTECH LTD.
Patent Owner
Stats
- 52 US PATENTS IN FORCE
- 6 US APPLICATIONS PENDING
- Dec 21, 2017 most recent publication
Details
- 52 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 2,995 Total Citation Count
- Feb 17, 1987 Earliest Filing
- 109 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2017/0365,484 PRINTING OF THREE-DIMENSIONAL METAL STRUCTURES WITH A SACRIFICIAL SUPPORTJan 14, 16Dec 21, 17[C23C, H01L, C25F]
2017/0189,995 PRINTING OF 3D STRUCTURES BY LASER-INDUCED FORWARD TRANSFERMay 20, 15Jul 06, 17[C23C, B23K, H01C, H05K]
2016/0299,103 APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSOct 02, 14Oct 13, 16[H01J, G01N]
2016/0233,089 LIFT PRINTING OF MULTI-COMPOSITION MATERIAL STRUCTURESOct 07, 14Aug 11, 16[C23C, H01L, H01G, H05K]
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9523714 Electrical inspection of electronic devices using electron-beam induced plasma probesJan 15, 14Dec 20, 16[H01J, G01R]
9232114 Imaging device and method for high-sensitivity optical scanning and integrated circuit thereforAug 14, 13Jan 05, 16[H01L, H04N, G01N]
8769471 Producing electrical circuit patterns using multi-population transformationOct 26, 09Jul 01, 14[G06F]
8536506 Imaging device and method for high-sensitivity optical scanning and integrated circuit thereforJan 17, 12Sep 17, 13[H01L]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2017/0294,291 APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSAbandonedSep 17, 15Oct 12, 17[H01J]
2016/0094,760 IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFORAbandonedDec 10, 15Mar 31, 16[H04N]
7986404 Inspection system employing illumination that is selectable over a continuous range anglesExpiredMar 20, 07Jul 26, 11[G01N]
2010/0001,192 GAMMA CAMERA SYSTEM WITH SLANTED DETECTORS, SLANTED COLLIMATORS, AND A SUPPORT HOODAbandonedJul 07, 08Jan 07, 10[G21K]
7636466 System and method for inspecting workpieces having microscopic featuresExpiredJan 11, 06Dec 22, 09[G06K]
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