OPTIMALTEST LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 9150
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 4443
 
  
 
B07C POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING 126
 
  
 
G01C MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 1104
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8872538 Systems and methods for test time outlier detection and correction in integrated circuit testingMar 14, 13Oct 28, 14[G01R]
8838408 Misalignment indication decision system and methodNov 11, 10Sep 16, 14[G01C, G01R]
8781773 System and methods for parametric testingJun 21, 11Jul 15, 14[H01L, G01N, G01R]
8421494 Systems and methods for test time outlier detection and correction in integrated circuit testingMay 23, 11Apr 16, 13[G01R]
8112249 System and methods for parametric test time reductionDec 22, 08Feb 07, 12[G06F]
8069130 Methods and systems for semiconductor testing using a testing scenario languageJun 29, 09Nov 29, 11[G06N, G06F]
7969174 Systems and methods for test time outlier detection and correction in integrated circuit testingApr 03, 09Jun 28, 11[G01R]
7777515 Methods and systems for semiconductor testing using reference diceDec 30, 08Aug 17, 10[G01R]
7737716 Methods and systems for semiconductor testing using reference diceDec 30, 08Jun 15, 10[G01R]
7679392 Methods and systems for semiconductor testing using reference diceDec 30, 08Mar 16, 10[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2012/0109,874 METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENARIO LANGUAGEAbandonedOct 18, 11May 03, 12[G06N, G06F]

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