NexGen Semi Holding, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 640
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2126
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 145
 
  
 
G03C PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES 145

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8658994 Apparatus and method for controlled particle beam manufacturingJan 20, 12Feb 25, 14[H01L, G21K]
8409984 Apparatus and method for manufacturing multi-component oxide heterostructuresJun 10, 10Apr 02, 13[H01L]
7993813 Apparatus and method for conformal mask manufacturingNov 21, 07Aug 09, 11[G03C]
7659526 Apparatus and method for controlled particle beam manufacturingAug 20, 07Feb 09, 10[H01J]
7507960 Apparatus and method for controlled particle beam manufacturingAug 17, 07Mar 24, 09[G21K]
7501644 Apparatus and method for controlled particle beam manufacturingAug 20, 07Mar 10, 09[H01J, G21K]
7495242 Apparatus and method for controlled particle beam manufacturingAug 20, 07Feb 24, 09[H01J, G21K]
7495244 Apparatus and method for controlled particle beam manufacturingAug 20, 07Feb 24, 09[H01J, G01K]
7495245 Apparatus and method for controlled particle beam manufacturingAug 20, 07Feb 24, 09[H01J, G21K]
7488960 Apparatus and method for controlled particle beam manufacturingAug 20, 07Feb 10, 09[H01J, G21K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0040,458 APPARATUS AND METHOD FOR CONFORMAL MASK MANUFACTURINGAbandonedOct 02, 12Feb 14, 13[H01L]
8278027 Apparatus and method for conformal mask manufacturingExpiredJul 21, 11Oct 02, 12[G03C]
2011/0167,913 IMAGING DEVICES FOR MEASURING THE STRUCTURE OF A SURFACEAbandonedOct 15, 10Jul 14, 11[G01N, H05K]
2010/0098,922 APPARATUS AND METHOD FOR CONTROLLED PARTICLE BEAM MANUFACTURINGAbandonedDec 18, 09Apr 22, 10[H01L, B32B]

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