Nanda Technologies GmbH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 5201
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 5357
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9355919 Methods and systems for inspecting bonded wafersAug 23, 11May 31, 16[H01L, G01N]
9182357 Semiconductor wafer inspection system and methodDec 23, 10Nov 10, 15[H01L, H04N, G01N]
8778702 Method of inspecting and processing semiconductor wafersAug 16, 10Jul 15, 14[H01L, G01N]
8501503 Methods of inspecting and manufacturing semiconductor wafersApr 26, 12Aug 06, 13[H01L]
8460946 Methods of processing and inspecting semiconductor substratesApr 18, 11Jun 11, 13[H01L]
8368881 Optical inspection system and methodOct 20, 11Feb 05, 13[G01N, G06K]
8345232 Optical inspection system and methodOct 29, 10Jan 01, 13[G01N, G06K]
8102521 Optical inspection system and methodOct 29, 10Jan 24, 12[G01N, G06K]
8072591 Optical inspection system and methodMar 01, 10Dec 06, 11[G01N, G06K]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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