NOVA MEASURING INSTRUMENTS INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 18110
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 11195
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS495
 
  
 
G01C MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 2103
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 244
 
  
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
  
 
F16M FRAMES, CASINGS, OR BEDS, OF ENGINES OR OTHER MACHINES OR APPARATUS, NOT SPECIFIC TO AN ENGINE, MACHINE, OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS OR SUPPORTS134
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 159
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
  
 
H05H PLASMA TECHNIQUE 129

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9594035 Silicon germanium thickness and composition determination using combined XPS and XRF technologiesApr 20, 15Mar 14, 17[G01N, G01B]
9588066 Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)Jan 23, 14Mar 07, 17[H01L, G01N]
9297771 Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopyAug 23, 13Mar 29, 16[H01J, B23Q, G21K, G01N]
9240254 System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopySep 27, 11Jan 19, 16[G21K, G01N]
9201030 Method and system for non-destructive distribution profiling of an element in a filmNov 14, 14Dec 01, 15[H01J, G01N, H03F]
8916823 Method and system for non-destructive distribution profiling of an element in a filmNov 14, 13Dec 23, 14[H01J, G01N, H03F]
8610059 Method and system for non-destructive distribution profiling of an element in a filmAug 23, 12Dec 17, 13[H01J]
8269167 Method and system for non-destructive distribution profiling of an element in a filmFeb 04, 11Sep 18, 12[H01J]
8011830 Method and system for calibrating an X-ray photoelectron spectroscopy measurementApr 27, 09Sep 06, 11[G01D]
7996178 Semiconductor substrate processing method and apparatusMay 17, 10Aug 09, 11[G01C]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7456399 Calibrating multiple photoelectron spectroscopy systemsExpiredMar 30, 06Nov 25, 08[H01J]
5167748 Plasma etching method and apparatusExpiredSep 06, 90Dec 01, 92[H01L]
5128543 Particle analyzer apparatus and methodExpiredOct 23, 89Jul 07, 92[H01J]
5032724 Multichannel charged-particle analyzerExpiredAug 09, 90Jul 16, 91[H01J]
5025144 Resistive anode encoder target and method producing baths charged and visual imagesExpiredOct 06, 88Jun 18, 91[H01J]
4882487 Direct imaging monochromatic electron microscopeExpiredNov 08, 88Nov 21, 89[H01J]
4810880 Direct imaging monochromatic electron microscopeExpiredJun 05, 87Mar 07, 89[H01J]
4737639 Energy and analysis detection system for surface chemical analysisExpiredJun 24, 87Apr 12, 88[H01J]

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