NEXTEST SYSTEMS CORPORATION

Patent Owner

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6153
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G11C STATIC STORES 1150

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8120375 Method for using probe cardAug 17, 06Feb 21, 12[G01R]
7861059 Method for testing and programming memory devices and system for sameFeb 03, 05Dec 28, 10[G06F]
7765080 System for testing smart cards and method for sameMay 19, 06Jul 27, 10[G01M, G06F, G01R, G11C]
7472326 Semiconductor test system having multitasking algorithmic pattern generatorMay 06, 03Dec 30, 08[G01R]
7385385 System for testing DUT and tester for use therewithJun 12, 02Jun 10, 08[]
7312604 Portable manipulator for stackable semiconductor test systemJul 29, 05Dec 25, 07[G01R]
7098650 Apparatus for planarizing a probe card and method using sameJul 28, 04Aug 29, 06[G01R]
6754868 Semiconductor test system having double data rate pin scramblingJun 29, 01Jun 22, 04[G06F, G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0100,322 PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEMAbandonedDec 21, 07May 01, 08[G01R]
7003697 Apparatus having pattern scrambler for testing a semiconductor device and method for operating sameExpiredJan 04, 02Feb 21, 06[G06F]

Top Inventors for This Owner

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