Micronics Japan Co., Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 5154
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8365130 Computer program and method for generating wire routing patternDec 28, 11Jan 29, 13[G06F]
7884630 IC carrie, IC socket and method for testing IC deviceMar 11, 05Feb 08, 11[G01R]
7800384 Probe unit substrateJan 14, 09Sep 21, 10[G01R]
7659727 Multilayer wiring board and method for testing the sameFeb 27, 08Feb 09, 10[G01R]
7656166 Multilayer wiring board and method for testing the sameFeb 27, 08Feb 02, 10[G01R]
7504843 Probe unit substrateDec 27, 07Mar 17, 09[G01R]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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