MULTITEST ELEKTRONISCHE SYSTEME GMBH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 16143
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 452
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 364
 
  
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 238
 
  
 
B65D CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES 296
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 2131
 
  
 
B25J MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES 157
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G01V GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 179

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9671428 Contact spring for a testing base for the high current testing of an electronic componentOct 22, 13Jun 06, 17[G01R]
9618534 Guide and support member for a device for testing electronic componentsMay 22, 15Apr 11, 17[G01R]
9541600 Method for positioning a carrier with a plurality of electronic components in a device for testing the electronic componentsDec 03, 14Jan 10, 17[G01R]
9255965 System for post-processsing of electronic componentsFeb 19, 14Feb 09, 16[G01R]
9035669 Apparatus and method for testing electronic devicesFeb 20, 13May 19, 15[G01R]
9014841 Device and method for removing tested semiconductor componentsJun 10, 13Apr 21, 15[H01L, G06F, G01R]
8964404 Elastic unit for clamping an electronic component and extending below an electronic component receiving volume of an align fixtureAug 17, 10Feb 24, 15[H01R, G01R, B65D, H05K]
8848931 Method and device for testing and calibrating electronic semiconductor components which convert sound into electrical signalsMar 12, 09Sep 30, 14[G01M, H04R, G01N, G01V]
8794613 Device and method for aligning and holding a plurality of singulated semiconductor components in receiving pockets of a terminal carrierJul 24, 13Aug 05, 14[B23Q]
8717048 System for post-processing of electronic componentsAug 18, 10May 06, 14[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0335,108 DEVICE AND METHOD FOR TESTING ELECTRONIC COMPONENT DEVICES ON A CARRIER OR A SUBSTRATEAbandonedJun 10, 13Dec 19, 13[G01R]
2013/0335,112 DEVICE FOR TESTING ELECTRONIC COMPONENT DEVICESAbandonedJun 13, 13Dec 19, 13[G01R]
2013/0321,011 TEST DEVICE, TEST SYSTEM, METHOD AND CARRIER FOR TESTING ELECTRONIC COMPONENTS UNDER VARIABLE PRESSURE CONDITIONSAbandonedMay 29, 13Dec 05, 13[G01R]
8449002 Closure mechanism for pressure test chambers for testing electronic components, in particular ICsExpiredJul 01, 08May 28, 13[E05B, B65D]
7946405 Guide path for electronic componentsExpiredDec 06, 07May 24, 11[B65G]
2010/0206,768 DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATED SEMICONDUCTOR COMPONENTS IN RECEIVING POCKETS OF A TERMINAL CARRIERAbandonedFeb 12, 09Aug 19, 10[H01L, G01R, B65D]
2010/0209,864 TEMPERING CHAMBER FOR TEMPERING ELECTRONIC COMPONENTS IN PARTICULAR IC'SAbandonedSep 25, 08Aug 19, 10[F27B]
2010/0164,482 CENTERING DEVICE FOR ELECTRONIC COMPONENTS, PARTICULARLY ICSAbandonedApr 24, 08Jul 01, 10[G01R]
7677383 Guide path for electronic componentsExpiredNov 30, 06Mar 16, 10[B65G]
7618074 Handling apparatus for passing electronic components, in particular ICs, to a testing apparatusExpiredNov 29, 05Nov 17, 09[B25J]
7581410 Low temperature testing device for electronic componentsExpiredJul 19, 05Sep 01, 09[F25D]
6870362 Docking apparatusExpiredApr 11, 03Mar 22, 05[G01R]
6836109 Guiding apparatus for docking a testing head for electronic componentsExpiredApr 15, 03Dec 28, 04[G01R]
4993588 Apparatus for separating objects of the same kind, in particular electronic components such as integrated circuitsExpiredJun 13, 89Feb 19, 91[B65G]
4908126 Apparatus for testing and sorting electronic components, in particular IC'sExpiredNov 10, 87Mar 13, 90[B07C]
4889242 Device for testing and sorting electronic components, more particularly integrated circuit chipsExpiredMay 28, 86Dec 26, 89[B07C]
4703858 Apparatus for testing and sorting oblong, electronic components, more particularly integrated chipsExpiredOct 21, 86Nov 03, 87[B07C]
4651090 Device for receiving components, particularly integrated chips, in an input and/or output magazine of a component testing machineExpiredDec 17, 85Mar 17, 87[G01R]

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