MPI CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 8881
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 9147
 
  
 
F25B REFRIGERATION MACHINES, PLANTS, OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS 365
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3359
 
  
 
F16L PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL268
 
  
 
F24H FLUID HEATERS, e.g. WATER OR AIR HEATERS, HAVING HEAT-GENERATING MEANS, IN GENERAL 225
 
  
 
H01F MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES 282
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 2131
 
  
 
H05B ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR 2109
 
  
 
A47B TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE 151

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0191,867 INTEGRATING SPHERE COVER AND INTEGRATING SPHERE MODULEOct 26, 16Jul 06, 17[G01J]
2017/0192,036 PROBE STRUCTURE AND PROBE DEVICEOct 26, 16Jul 06, 17[G01R]
2017/0176,497 MICROELECTROMECHANICAL PROBE, METHOD OF MANUFACTURING THE SAME AND PROBE SETDec 15, 16Jun 22, 17[B81C, B81B, G01R]
2017/0115,326 PROBE MODULEOct 25, 16Apr 27, 17[G01R]
2017/0097,376 SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAMESep 30, 16Apr 06, 17[G01R]
2017/0082,235 WORKING FLUID PIPE FOR TEMPERATURE CONTROL SYSTEMSep 16, 16Mar 23, 17[F16L]
2017/0059,615 PROBE HEADJun 24, 16Mar 02, 17[G01R]
2017/0018,068 PROBE DEVICEMar 07, 16Jan 19, 17[H04N, G06T]
2016/0305,981 Probe CardApr 13, 16Oct 20, 16[G01R]
2016/0238,284 ADAPTIVE TEMPERATURE CONTROL SYSTEM FOR COOLING WORKING FLUIDFeb 04, 16Aug 18, 16[F25B]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9903888 Probe card and test equipment with the sameAug 13, 15Feb 27, 18[G01R]
9889454 Fluid discharge deviceJun 22, 15Feb 13, 18[B05B, G01R]
9880252 Method of calibrating and debugging testing systemJan 09, 17Jan 30, 18[G01R]
9835651 Cantilever type probe card for high frequency signal transmissionFeb 11, 15Dec 05, 17[G01R]
9823272 Wafer testing probe cardJan 24, 14Nov 21, 17[G01R]
9759743 Testing system and method for testing of electrical connectionsNov 25, 14Sep 12, 17[G01R]
9759746 Probe moduleDec 02, 14Sep 12, 17[G01R]
9746495 Probe device having spring probeFeb 23, 15Aug 29, 17[G01R]
9658249 Probe card capable of transmitting high-frequency signalsDec 24, 13May 23, 17[G01R]
9658250 Vertical probe device having positioning filmDec 22, 15May 23, 17[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0223,590 PROBE HEAD AND UPPER GUIDER PLATEAbandonedFeb 01, 16Aug 04, 16[G01R]
2015/0355,235 PROBE AND METHOD FOR MANUFACTURING THE PROBEAbandonedJun 05, 15Dec 10, 15[B81C, G01R]
2015/0185,254 MANUFACTURING METHOD OF PROBING DEVICEAbandonedMar 13, 15Jul 02, 15[G01R, H01F, H05K]
2015/0168,454 PROBE MODULEAbandonedDec 02, 14Jun 18, 15[G01R]
2014/0016,124 OPTICAL INSPECTION DEVICEAbandonedJul 12, 13Jan 16, 14[G01N]
8542027 Probe cardExpiredMar 17, 10Sep 24, 13[G01R]
2012/0242,360 High-frequency coupling testing device by coupling effectAbandonedMar 20, 12Sep 27, 12[H01P, G01R]
2012/0038,383 DIRECT-DOCKING PROBING DEVICEAbandonedApr 21, 11Feb 16, 12[G01R]
2011/0128,028 PROBE CARD, MAINTENANCE APPARATUS AND METHOD FOR THE SAMEAbandonedNov 29, 10Jun 02, 11[G01R]
2011/0095,778 PROBE CARDAbandonedOct 26, 10Apr 28, 11[G01R]
7595651 Cantilever-type probe card for high frequency applicationExpiredFeb 13, 07Sep 29, 09[G01R]
7446548 Elastic micro probe and method of making sameExpiredJan 10, 06Nov 04, 08[G01R]
7267557 Micro contact device comprising the micro contact element and the base memberExpiredJan 27, 06Sep 11, 07[H01R]
7154284 Integrated circuit probe cardExpiredJan 06, 05Dec 26, 06[G01R]
7053636 Probe device for electrical testing an integrated circuit device and probe card using the sameExpiredMay 25, 04May 30, 06[G01R]
6984998 Multi-function probe cardExpiredJul 21, 04Jan 10, 06[G01R]

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